Original document(11 pages) Authorized document(11 pages) 中文版
    A signal detecting method for IC chip features that the first IC chip outputs one of different test patterns, the second IC chip receives and latches the test pattern for obtain the received data and then determines if the received data is correct according to said pattern and data, and if there is error (at least one error bit), the relative signal line which has noise interference can be indicated out.
Application Number
申请号		 03100924 Application Date
申请日		 2003.01.07
Title 名称 Signal test method for integrated circuit chips
Publication Number
公开号		 1424752 Publication Date
公开日		 2003.06.18
Approval Pub. Date Granted Pub. Date 2005.04.20
International Classification 分类号 H01L21/66,G01R31/28,H01L21/82,H01L27/00
Applicant(s) Name
申请人		 Weisheng Electronic Co., Ltd.
Address 地址
Inventor(s) Name 发明人 Lin Yiming
Attorney & Agent 代理人 huang xiaolin wang zhisen

  
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