An apparatus for the detection of surface flaws (F) in material (27) having a surface (25) which is partially reflective includes at least one light source (23, 23') arranged to direct incident light on a surface of an at least partially reflective material (27), and a light detector (29) disposed above the surface of the material (27). The light detector (29) and the at least one light source (23, 23') are arranged relative to each other such that, in the absence of a surface flaw (F) in the material (27), substantially no light from the at least one light source (23, 23') is detected by the detector (29) and, in the presence of a surface flaw (F) in the material (27), light from the at least one light source (23, 23') is reflected off of the flaw (F) and into the detector (29). |