Original document(21 pages) Authorized document(23 pages) 中文版
    A radio frequency (RF) multi-testing apparatus and method for rapid (e.g. production line) testing of a wireless communications device for operational adherence of the device to a pre-determined reference specification defining specific absorption rate (SAR) parameters correlated to the device and for simultaneous testing of the body loss of the device. The device is positioned within an RF shielded enclosure and operated at a test transmit power. A linear array of E-field isotropic probes (e.g. five) are positioned at a pre-determined location in the container within human tissue simulation matter and measure the electric-field therein. A plurality of RF isotropic probes are spatially distributed within the container and measure the RF power received thereby, with the container providing reflective surfaces therein. Computer processing means compares the electric-field measurements to the SAR reference specification and determines therefrom whether the device adheres to the specification. The computer processing means also combines the RF power measurements and produces a value representing the averaged integrated body loss of the device. The determination of whether the device adheres to the SAR specification also determines a measure of the metallic system integrity of the device.
Application Number
申请号
01810869 Application Date
申请日
2001.04.25
Title 名称 Apparatus and method for production testing of the RF performance of wireless communications devices
Publication Number
公开号
1434924 Publication Date
公开日
2003.08.06
Approval Pub. Date 2006.10.04 Granted Pub. Date 2006.10.04
International Classification 分类号 G01R29/08;H04Q7/34
Applicant(s) Name
申请人
Jacek J. Wojcik
Address 地址
Inventor(s) Name 发明人 Jacek J. Wojcik
Attorney & Agent 代理人 chen gong lou xianyang
More information 更  多  信  息


 Related patents information
Google
Note:All patent data come from State Intellectual Property Office of the People's Republic of China. If there were discrepancies between here and the State Intellectual Property office, the later is more accurate. The patent data is only for public exchange and learning purposes. We are not responsible for the adverse consequences with unverified use of the data.