Original document(14 pages) Authorized document(15 pages) 中文版
    A process for preparing a MOS transistor in order to prevent the grid depletion of MOS transistor in NROM and increase the grid drive power includes providing a semiconductor chip having the defined memory array area and peripheral circuit area on its surface, generating a grid consisting of a Si-O layer, a non-crystal Si layer and a silicon germanium layer on the surface of said peripheral circuit area, generating the side wall, source and drain around the grid, generating a Ni layer on the top of grid, and fast annealing at 400-500 deg.C for generating a Ni-Si layer on silicon germanium layer.
Application Number
申请号
02103355 Application Date
申请日
2002.01.30
Title 名称 Method for mfg. MOS transistor with low grid depletion phenomenon
Publication Number
公开号
1435868 Publication Date
公开日
2003.08.13
Approval Pub. Date Granted Pub. Date 2006.03.22
International Classification 分类号 H01L21/336
Applicant(s) Name
申请人
Wanghong Electronics Co., Ltd.
Address 地址
Inventor(s) Name 发明人
Attorney & Agent 代理人 tao fengbei hou yu
More information 更  多  信  息


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