Original document(19 pages) Authorized document(19 pages) 中文版
    A test element and method for mask-type ROM in order to find its leakage path is characterized by that said test element is composed of several bit lines on a substrate and several character lines perpendicular to said bit lines. The both ends of each bit line are not covered by character lines.
Application Number
申请号		 02102847 Application Date
申请日		 2002.01.28
Title 名称 Screen read-only memory testing element and method
Publication Number
公开号		 1435889 Publication Date
公开日		 2003.08.13
Approval Pub. Date 2006.11.29 Granted Pub. Date 2006.11.29
International Classification 分类号 H01L27/112,H01L21/66,H01L21/824,G01R31/28
Applicant(s) Name
申请人		 Wanghong Electronics Co., Ltd.
Address 地址
Inventor(s) Name 发明人 Fan Zuohong, Ye Yanhong
Attorney & Agent 代理人 wang huaqiang
More information 更  多  信  息


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