Original document(11 pages)  中文版
    The invention relates to the chiseling and the eroding method of the several crystal silicon bar, the process is showed below: (1) the chiseling and eroding process before the beginning chisel; (2) the beginning chisel; (3) the main chisel: (4) the exceeding chisel. The chiseling and eroding process of the beginning chisel acts before the multicrystal chiseling and the eroding and after the hard hiding film chiseling and eroding, the SF3 or NF3 is served as the reactive gas, or the one sort or the several sorts of CxHyFz, Cl2, O2, are choose. The eroding method can wipe off the polymer remain of the light glue on the surface of the silicon, the effect of the roughness degree is reduced.
Application Number
申请号
200510126289 Application Date
申请日
2005.12.02
Title 名称 Polycrystalline silicon etching method for improving line roughness
Publication Number
公开号
1851049 Publication Date
公开日
2006.10.25
Approval Pub. Date Granted Pub. Date
International Classification 分类号 C23F1/12
Applicant(s) Name
申请人
Beijing Bctronic Base Equipment and Process Research Center LLC
Address 地址 100016
Inventor(s) Name 发明人
Attorney & Agent 代理人 si junzhi

  
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