Original document(41 pages)  中文版
    In an abnormal state determination method, the state of a first contact that is set to be open normally and closed in an operation is detected. The state of a second contact that is set to be closed normally and open in the operation complementarily to the first contact is detected. The detected states of the first and second contacts are compared, and abnormality is determined when the first and second contacts are in the same state. An abnormal state determination apparatus is also disclosed.
Application Number
申请号		 200610110746 Application Date
申请日		 2006.08.08
Title 名称 Abnormal state determination method and apparatus
Publication Number
公开号		 1911658 Publication Date
公开日		 2007.02.14
Approval Pub. Date Granted Pub. Date
International Classification 分类号 B41F33/04;B41F33/16
Applicant(s) Name
申请人		 Komori Printing Mach
Address 地址
Inventor(s) Name 发明人 Yozu Tsukamoto
Attorney & Agent 代理人 wang beibei
More information 更  多  信  息


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