Original document(59 pages)  中文版
    In an abnormal state determination method, a detection target that can at least take two states is monitored. Abnormality is determined when one state of the detection target is detected, and then, another state of the detection target is detected within a preset time. An abnormal state determination apparatus is also disclosed.
Application Number
申请号		 200610110747 Application Date
申请日		 2006.08.08
Title 名称 Abnormal state determination method and apparatus
Publication Number
公开号		 1911659 Publication Date
公开日		 2007.02.14
Approval Pub. Date Granted Pub. Date
International Classification 分类号 B41F33/04;B41F33/16
Applicant(s) Name
申请人		 Komori Printing Mach
Address 地址
Inventor(s) Name 发明人 Tsukamoto Yozu
Attorney & Agent 代理人 wang beibei
More information 更  多  信  息


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