Original document(34 pages)  中文版
    The inveniton discloses a method and apparatus for process integration in manufacture of a photomask are disclosed. In one embodiment, a cluster tool suitable for process integration in manufacture of a photomask including a vacuum transfer chamber having coupled thereto at least one hard mask deposition chamber and at least one plasma chamber configured for etching chromium. In another embodiment, a method for process integration in manufacture of a photomask includes depositing a hard mask on a substrate in a first processing chamber, depositing a resist layer on the substrate, patterning the resist layer, etching the hard mask through apertures formed in the patterned resist layer in a second chamber; and etching a chromium layer through apertures formed in the hard mask in a third chamber.
Application Number
申请号
200610104045 Application Date
申请日
2006.07.31
Title 名称 Chemical vapor deposition chamber with dual frequency bias and method for manufacturing a photomask using the same
Publication Number
公开号
1912178 Publication Date
公开日
2007.02.14
Approval Pub. Date Granted Pub. Date
International Classification 分类号 C23C16/00;C23C16/34;H01L21/205
Applicant(s) Name
申请人
Applied Materials Inc.
Address 地址
Inventor(s) Name 发明人 Kumar Ajay;Grewal Virinder;Yau Wai-fan
Attorney & Agent 代理人 zhao fei
More information 更  多  信  息


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Cluster tool and method for process integration in manufacturing of a photomask
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