Original document(40 pages)  中文版
    A memory element is formed by providing an organic compound between a pair of upper and lower electrodes. However, when the electrode is formed over a layer containing an organic compound, a temperature is limited because the layer containing the organic compound can be influenced depending on a temperature for forming the electrode. A forming method for the electrode is limited due to this limitation of a temperature. Therefore, there are problems that an expected electrode cannot be formed, and miniaturization of an element is inhibited. A semiconductor device includes a memory element and a switching element which are provided over a substrate having an insulating surface. The memory element includes first and second electrodes, and a layer containing an organic compound, which are provided on the same plane. A current flows from the first electrode to the second electrode. The first electrode is electrically connected to the switching element.
Application Number
申请号
200610111014 Application Date
申请日
2006.08.11
Title 名称 Semiconductor device and method for manufacturing the same
Publication Number
公开号
1913170 Publication Date
公开日
2007.02.14
Approval Pub. Date Granted Pub. Date
International Classification 分类号 H01L27/28;H01L51/00
Applicant(s) Name
申请人
Semiconductor Energy Lab
Address 地址
Inventor(s) Name 发明人 Kato Kiyoshi;Sato Takehisa
Attorney & Agent 代理人 zhang xin
More information 更  多  信  息


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