Original document(13 pages)  中文版
    An in-situ treating method for the polishing liquid used for chemico-mechanical polishing (CMP) of metal features that based on the electrochemical principle, the metallic ions generated by polishing are removed by reducing transfer and the function of oxidant in polishing liquid is restored. Its apparatus features that the in-situ treating system of polishing liquid and the in-line repairing system of polishing disc are additionally used in the traditional polishing system.
Application Number
申请号
200610030551 Application Date
申请日
2006.08.30
Title 名称 Method for batch processing polishing fluid in situ for chemico-mechanical polishing metal, and equipment utilized
Publication Number
公开号
1915595 Publication Date
公开日
2007.02.21
Approval Pub. Date Granted Pub. Date
International Classification 分类号 B24B57/00;C25C1/00;B24B53/00
Applicant(s) Name
申请人
Shanghai Inst of Microsystems and Information, C.A.S
Address 地址
Inventor(s) Name 发明人 Zhang Kailiang;Song Zhitang;Feng Songlin;Chen Bangming
Attorney & Agent 代理人 pan zhen
More information 更  多  信  息


 Related patents information
Chemical and mechanical leveling polishing liquid for multilayer copper wire in large scale integrated circuit
Nm-class unsaturated polyester/montmorillonite composition and its preparing process
Method for controlling adsorption state of particles adsorbed on surface of polished silicon substrate for integrated circuit
Method for preparing silicasol with big grain diameter
Nano polishing liquid for sulfuric compound phase changing material chemical mechanical polishing and its use
Sulphurs phase-change material chemically machinery polished non-abrasive polishing liquid and its use
Nano polishing liquid for high dielectric material strontium barium titanate chemical-mechanical polish
Wet-method etching liquid for making phase change storage and its wet-method etching process
Chemical mechanical polishing pulp for sapphire substrate underlay
A method for manufacturing of globally interconnected copper engraved structure
Google
Note:All patent data come from State Intellectual Property Office of the People's Republic of China. If there were discrepancies between here and the State Intellectual Property office, the later is more accurate. The patent data is only for public exchange and learning purposes. We are not responsible for the adverse consequences with unverified use of the data.