Original document(18 pages)  中文版
    The invention is concerned with the mask and the mask using method that is used for continuous transverse crystallization technology. The mask includes: at least one transparent grid that includes two long borders, namely the front edge and the rear edge, the borders are parallel and same length, the front edge faces to the outer jut of the transparent grid, the rear edge faces to the inner hollow of the transparent grid. The invention can be used to remove the un-symmetrical area effectively, avoid the problem of craftwork speed drop. By the increase of the craftwork speed, the invention can reduce the overlapping fusing area in order to prevent the polycrystalline silicon layer to absorb more laser energy, and reduces the possibility that the polycrystalline silicon layer breaks as the conglomerate-block effect.
Application Number
申请号
200510103240 Application Date
申请日
2005.09.16
Title 名称 Mask for continuous transverse crystallizing technology and method using the same mask
Publication Number
公开号
1933098 Publication Date
公开日
2007.03.21
Approval Pub. Date Granted Pub. Date
International Classification 分类号 H01L21/00;H01L21/20;H01L21/324;C30B1/02;C30B29/06
Applicant(s) Name
申请人
Youda Photoelectric Co., Ltd.
Address 地址
Inventor(s) Name 发明人
Attorney & Agent 代理人 taohai ping
More information 更  多  信  息


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