Original document(12 pages)  中文版
    The invention is concerned with the strain source-drain manufacture method using new hard mask, it is: uses boron to adulterate silica glass as the new hard mask, processes polycrystalline silicon grid to erode, the hard mask can protect polycrystalline silicon grid to avoid erode and extend of the silicon germanium on the polycrystalline silicon grid when the silica in the source / leaking area hollow erodes and the silicon germanium extends, the hard mask is easy to be remove and the remove process will not destroy the sidewall interlayer between the grid and the source / leaking, when processes the wetting remove by the mixture of the hydrofluoric acid and the sulfuric acid or the hydrofluoric acid and the vinyl alcohol.
Application Number
申请号
200510029703 Application Date
申请日
2005.09.15
Title 名称 Strain source-drain producing method utilizing new hard mask
Publication Number
公开号
1933112 Publication Date
公开日
2007.03.21
Approval Pub. Date Granted Pub. Date
International Classification 分类号 H01L21/336
Applicant(s) Name
申请人
Zhongxin International Integrated Circuit Manufacturing (Shanghai) Co., Ltd.
Address 地址
Inventor(s) Name 发明人
Attorney & Agent 代理人 louxian yang
More information 更  多  信  息


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