The invention relates to a method to measure the high pressure insulator zero values by the laser which is made up of the semiconductor lasing light emitter, the polarized light system, the optical analyzer, the photoelectric detector, the signal processing circuit and the computer system. The first process: the polarized laser generated by the semiconductor lasing light emitter and the polarized light system is emitted to the scanning insulator cluster; the second process: the polarized laser generates the diffuse reflection light by the scanning insulator cluster which is detected by the optical analyzer, then the light is projected to the photoelectric detector to induce the light intensity; the third process: the photoelectric detector transforms the light intensity to the electric signal and transfers to the signal processing circuit to get the data; the forth process: the processed data is analyzed by the computer to get the conclusion. So the invention is new and safe, also it has the high efficient. |