Original document(15 pages)  中文版
    Systems and methods for reducing temperature dissipation during burn-in testing are described. A plurality of devices under test are each subject to a body bias voltage. The body bias voltage reduces or substantially minimizes leakage current associated with the devices under test. Accordingly, heat dissipation is reduced during burn-in.
Application Number
申请号		 200580009762 Application Date
申请日		 2005.03.01
Title 名称 System and method pertaining to burn-in testing
Publication Number
公开号		 1938598 Publication Date
公开日		 2007.03.28
Approval Pub. Date Granted Pub. Date
International Classification 分类号 G01R31/28
Applicant(s) Name
申请人		 Transmeta Corp.
Address 地址
Inventor(s) Name 发明人
Attorney & Agent 代理人 zhangwei
More information 更  多  信  息


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