The object of this invention is to improve the examining precision of the display device which has a dislay element in each pixel. The present inventon provide a display device, each pixel has a display element, a pixel transistor which controls an operation of the display element, and a storage capacitor which stores charges corresponding to display data for a predetermined period. During a normal operation, a capacitor signal to be output to a capacitor line connected to each storage capacitor is AC driven in a predetermined period to improve display quality or the like. A structure to fix the capacitor signal to be output to the capacitor line to a fixed level during defect inspection of the pixel or the like is formed on a substrate simultaneously with a pixel circuit or the like. With this structure, the inspection precision can be improved when the defect inspection of each pixel is to be detected from capacitance value data or the like in each pixel. It is also possible to allow setting of the fixed level in the inspection to an arbitrary inspection voltage suitable for the inspection. |